英 [?rel?tiv ?s?:fis] 美 [?r?l?t?v ?s?f?s]
[釋義]相對曲面;
[例句]White light scanning profiler is based on the characteristic of white
light interference to resolve corresponding relative surface height.
依據白光掃描輪廓儀是根據白光的幹涉特性求解被測物的表面相對高度。